CSC632 ULSI Testing

[3–0, 3 cr.]

This course covers the problems of testing of Ultra Large Scale Integrated Circuits (ULSI), the design of circuits for testability, the design of built-in self-testing circuits, and the use of the IEEE Boundary Scan Standards. Topics include an introduction to the testing process, fault modeling and detection, logic and fault simulation, testability measures, test generation for combinational circuits, test generation for sequential circuits, design for testability, built-in self-test, delay testing, current testing, ATPG-based logic synthesis, system test and core-based design, and testing a system-on-a-chip.

Note: This course has not been taught since Fall 2021 and will not be taught during the academic year 20234-2025.