COE529 Testing for Digital Integrated Circuits (previously offered as COE599F)

[3–0, 3 cr.]

[3-0, 3 cr.]

This course covers the essentials of electronic testing for digital ULSI circuits, design methods, and design for testability. Topics include introduction to the testing process, fault modeling and detection, logic and fault simulation, testability measures, test generation for combinational circuits, test generation for sequential circuits, design for testability, built-in self-testing, ATPG-based logic synthesis, Boundary Scan, and system test and core-based design.

Prerequisites: COE321 Logic Design and 3rd-year standing.