COE728 ULSI Testing (Last Offered: Fall 2013)

[3–0, 3 cr.]

This course covers the problems of testing of Ultra Large Scale Integrated Circuits (ULSI), the design of circuits for testability, the design of built-in self-testing circuits, and the use of the IEEE Boundary Scan Standards. Topics include introduction to the testing process, fault modeling and detection, logic and fault simulation, testability measures, test generation for combinational circuits, test generation for sequential circuits, design for testability, built-in self-test, delay testing, current testing, ATPG-based logic synthesis, system test, and core-based design, and testing a system-on-a-chip (SOC).

Note: This course has not been taught since Fall 2024 and will not be taught in this academic year 2026–2027.